2,131 research outputs found
Turbo Decoding and Detection for Wireless Applications
A historical perspective of turbo coding and turbo transceivers inspired by the generic turbo principles is provided, as it evolved from Shannon’s visionary predictions. More specifically, we commence by discussing the turbo principles, which have been shown to be capable of performing close to Shannon’s capacity limit. We continue by reviewing the classic maximum a posteriori probability decoder. These discussions are followed by studying the effect of a range of system parameters in a systematic fashion, in order to gauge their performance ramifications. In the second part of this treatise, we focus our attention on the family of iterative receivers designed for wireless communication systems, which were partly inspired by the invention of turbo codes. More specifically, the family of iteratively detected joint coding and modulation schemes, turbo equalization, concatenated spacetime and channel coding arrangements, as well as multi-user detection and three-stage multimedia systems are highlighted
Protograph-Based LDPC Code Design for Probabilistic Shaping with On-Off Keying
This work investigates protograph-based LDPC codes for the AWGN channel with
OOK modulation. A non-uniform distribution of the OOK modulation symbols is
considered to improve the power efficiency especially for low SNRs. To this
end, a specific transmitter architecture based on time sharing is proposed that
allows probabilistic shaping of (some) OOK modulation symbols. Tailored
protograph-based LDPC code designs outperform standard schemes with uniform
signaling and off-the-shelf codes by 1.1 dB for a transmission rate of 0.25
bits/channel use.Comment: Invited Paper for CISS 201
Novel fault tolerant Multi-Bit Upset (MBU) Error-Detection and Correction (EDAC) architecture
Desde el punto de vista de seguridad, la certificación aeronáutica de
aplicaciones críticas de vuelo requiere diferentes técnicas que son usadas
para prevenir fallos en los equipos electrónicos. Los fallos de tipo hardware
debido a la radiación solar que existe a las alturas standard de vuelo, como
SEU (Single Event Upset) y MCU (Multiple Bit Upset), provocan un cambio
de estado de los bits que soportan la información almacenada en memoria.
Estos fallos se producen, por ejemplo, en la memoria de configuración de
una FPGA, que es donde se definen todas las funcionalidades. Las técnicas
de protección requieren normalmente de redundancias que incrementan el
coste, número de componentes, tamaño de la memoria y peso.
En la fase de desarrollo de aplicaciones críticas de vuelo, generalmente
se utilizan una serie de estándares o recomendaciones de diseño como
ABD100, RTCA DO-160, IEC62395, etc, y diferentes técnicas de protección
para evitar fallos del tipo SEU o MCU. Estas técnicas están basadas en
procesos tecnológicos específicos como memorias robustas, codificaciones
para detección y corrección de errores (EDAC), redundancias software,
redundancia modular triple (TMR) o soluciones a nivel sistema.
Esta tesis está enfocada a minimizar e incluso suprimir los efectos de los
SEUs y MCUs que particularmente ocurren en la electrónica de avión como
consecuencia de la exposición a radiación de partículas no cargadas (como
son los neutrones) que se encuentra potenciada a las típicas alturas de
vuelo. La criticidad en vuelo que tienen determinados sistemas obligan a que
dichos sistemas sean tolerantes a fallos, es decir, que garanticen un
correcto funcionamiento aún cuando se produzca un fallo en ellos. Es por
ello que soluciones como las presentadas en esta tesis tienen interés en el
sector industrial.
La Tesis incluye una descripción inicial de la física de la radiación
incidente sobre aeronaves, y el análisis de sus efectos en los componentes
electrónicos aeronaúticos basados en semiconductor, que desembocan en
la generación de SEUs y MCUs. Este análisis permite dimensionar
adecuadamente y optimizar los procedimientos de corrección que se
propongan posteriormente.
La Tesis propone un sistema de corrección de fallos SEUs y MCUs que
permita cumplir la condición de Sistema Tolerante a Fallos, a la vez que
minimiza los niveles de redundancia y de complejidad de los códigos de
corrección. El nivel de redundancia es minimizado con la introducción del
concepto propuesto HSB (Hardwired Seed Bits), en la que se reduce la
información esencial a unos pocos bits semilla, neutros frente a radiación.
Los códigos de corrección requeridos se reducen a la corrección de un único
error, gracias al uso del concepto de Distancia Virtual entre Bits, a partir del
cual será posible corregir múltiples errores simultáneos (MCUs) a partir de
códigos simples de corrección.
Un ejemplo de aplicación de la Tesis es la implementación de una
Protección Tolerante a Fallos sobre la memoria SRAM de una FPGA. Esto
significa que queda protegida no sólo la información contenida en la
memoria sino que también queda auto-protegida la función de protección
misma almacenada en la propia SRAM. De esta forma, el sistema es capaz
de auto-regenerarse ante un SEU o incluso un MCU, independientemente
de la zona de la SRAM sobre la que impacte la radiación. Adicionalmente,
esto se consigue con códigos simples tales como corrección por bit de
paridad y Hamming, minimizando la dedicación de recursos de computación
hacia tareas de supervisión del sistema.For airborne safety critical applications certification, different techniques
are implemented to prevent failures in electronic equipments. The HW
failures at flying heights of aircrafts related to solar radiation such as SEU
(Single-Event-Upset) and MCU (Multiple Bit Upset), causes bits alterations
that corrupt the information at memories. These HW failures cause errors, for
example, in the Configuration-Code of an FPGA that defines the
functionalities. The protection techniques require classically redundant
functionalities that increases the cost, components, memory space and
weight.
During the development phase for airborne safety critical applications,
different aerospace standards are generally recommended as ABD100,
RTCA-DO160, IEC62395, etc, and different techniques are classically used
to avoid failures such as SEU or MCU. These techniques are based on
specific technology processes, Hardened memories, error detection and
correction codes (EDAC), SW redundancy, Triple Modular Redundancy
(TMR) or System level solutions.
This Thesis is focussed to minimize, and even to remove, the effects of
SEUs and MCUs, that particularly occurs in the airborne electronics as a
consequence of its exposition to solar radiation of non-charged particles (for
example the neutrons). These non-charged particles are even powered at
flying altitudes due to aircraft volume. The safety categorization of different
equipments/functionalities requires a design based on fault-tolerant approach
that means, the system will continue its normal operation even if a failure
occurs. The solution proposed in this Thesis is relevant for the industrial
sector because of its Fault-tolerant capability.
Thesis includes an initial description for the physics of the solar radiation
that affects into aircrafts, and also the analyses of their effects into the
airborne electronics based on semiconductor components that create the
SEUs and MCUs. This detailed analysis allows the correct sizing and also
the optimization of the procedures used to correct the errors.
This Thesis proposes a system that corrects the SEUs and MCUs
allowing the fulfilment of the Fault-Tolerant requirement, reducing the
redundancy resources and also the complexity of the correction codes. The
redundancy resources are minimized thanks to the introduction of the
concept of HSB (Hardwired Seed Bits), in which the essential information is
reduced to a few seed bits, neutral to radiation. The correction codes
required are reduced to the correction of one error thanks to the use of the
concept of interleaving distance between adjacent bits, this allows the
simultaneous multiple error correction with simple single error correcting
codes.
An example of the application of this Thesis is the implementation of the
Fault-tolerant architecture of an SRAM-based FPGA. That means that the
information saved in the memory is protected but also the correction
functionality is auto protected as well, also saved into SRAM memory. In this
way, the system is able to self-regenerate the information lost in case of
SEUs or MCUs. This is independent of the SRAM area affected by the
radiation. Furthermore, this performance is achieved by means simple error
correcting codes, as parity bits or Hamming, that minimize the use of
computational resources to this supervision tasks for system.Programa Oficial de Doctorado en Ingeniería Eléctrica, Electrónica y AutomáticaPresidente: Luis Alfonso Entrena Arrontes.- Secretario: Pedro Reviriego Vasallo.- Vocal: Mª Luisa López Vallej
ECC Memory for Fault Tolerant RISC-V Processors
Numerous processor cores based on the popular RISC-V Instruction Set Architecture have been developed in the past few years and are freely available. The same applies for RISC-V ecosystems that allow to implement System-on-Chips with RISC-V processors on ASICs or FPGAs. However, so far only very little concepts and implementations for fault tolerant RISC-V processors are existing. This inhibits the use of RISC-V for safety-critical applications (as in the automotive domain) or within radiation environments (as in the aerospace domain). This work enhances the existing implementations Rocket and BOOM with a generic Error Correction Code (ECC) protected memory as a first step towards fault tolerance. The impact of the ECC additions on performance and resource utilization are discussed
Exploration and Analysis of Combinations of Hamming Codes in 32-bit Memories
Reducing the threshold voltage of electronic devices increases their
sensitivity to electromagnetic radiation dramatically, increasing the
probability of changing the memory cells' content. Designers mitigate failures
using techniques such as Error Correction Codes (ECCs) to maintain information
integrity. Although there are several studies of ECC usage in spatial
application memories, there is still no consensus in choosing the type of ECC
as well as its organization in memory. This work analyzes some configurations
of the Hamming codes applied to 32-bit memories in order to use these memories
in spatial applications. This work proposes the use of three types of Hamming
codes: Ham(31,26), Ham(15,11), and Ham(7,4), as well as combinations of these
codes. We employed 36 error patterns, ranging from one to four bit-flips, to
analyze these codes. The experimental results show that the Ham(31,26)
configuration, containing five bits of redundancy, obtained the highest rate of
simple error correction, almost 97\%, with double, triple, and quadruple error
correction rates being 78.7\%, 63.4\%, and 31.4\%, respectively. While an ECC
configuration encompassed four Ham(7.4), which uses twelve bits of redundancy,
only fixes 87.5\% of simple errors
Protograph-Based LDPC Code Design for Ternary Message Passing Decoding
A ternary message passing (TMP) decoding algorithm for low-density
parity-check codes is developed. All messages exchanged between variable and
check nodes have a ternary alphabet, and the variable nodes exploit soft
information from the channel. A density evolution analysis is developed for
unstructured and protograph-based ensembles. For unstructured ensembles the
stability condition is derived. Optimized ensembles for TMP decoding show
asymptotic gains of up to 0.6 dB with respect to ensembles optimized for binary
message passing decoding. Finite length simulations of codes from TMP-optimized
ensembles show gains of up to 0.5 dB under TMP compared to protograph-based
codes designed for unquantized belief propagation decoding
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