CORE
🇺🇦
make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Filters
1 research outputs found
A high performance scan flip-flop design for serial and mixed mode scan test
Author
Ahlawat Satyadev
Matrosova Anjela Yu.
Singh Virendra
Tudu Jaynarayan
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
01/01/2016
Field of study
Get PDF
Tomsk State University Repository
Get PDF
