PZnet: Efficient 3D ConvNet Inference on Manycore CPUs

Convolutional nets have been shown to achieve state-of-the-art accuracy in many biomedical image analysis tasks. Many tasks within biomedical analysis domain involve analyzing volumetric (3D) data acquired by CT, MRI and Microscopy acquisition methods. To deploy convolutional nets in practical working systems, it is important to solve the efficient inference problem. Namely, one should be able to apply an already-trained convolutional network to many large images using limited computational resources. In this paper we present PZnet, a CPU-only engine that can be used to perform inference for a variety of 3D convolutional net architectures. PZNet outperforms MKL-based CPU implementations of PyTorch and Tensorflow by more than 3.5x for the popular U-net architecture. Moreover, for 3D convolutions with low featuremap numbers, cloud CPU inference with PZnet outperfroms cloud GPU inference in terms of cost efficiency

Delivering knowledge in the field: A telecommunications service provision and maintenance case

This paper proposes a novel approach to providing knowledge management services in a business process wherein field engineers are the main process actors, providing and maintaining telecommunications services. Cooperating multi-agents play a central role for the provision of knowledge management services by integrating heterogeneous systems to collect related knowledge for the execution of mobile tasks. The proposed system is expected to increase both the performance of the mobile workforce and customer satisfaction by supporting and encouraging knowledge sharing

Sparsity-Based Super Resolution for SEM Images

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the surface topography and composition. The sample is scanned by the electron beam point by point, until an image of the surface is formed. Since its invention in 1942, SEMs have become paramount in the discovery and understanding of the nanometer world, and today it is extensively used for both research and in industry. In principle, SEMs can achieve resolution better than one nanometer. However, for many applications, working at sub-nanometer resolution implies an exceedingly large number of scanning points. For exactly this reason, the SEM diagnostics of microelectronic chips is performed either at high resolution (HR) over a small area or at low resolution (LR) while capturing a larger portion of the chip. Here, we employ sparse coding and dictionary learning to algorithmically enhance LR SEM images of microelectronic chips up to the level of the HR images acquired by slow SEM scans, while considerably reducing the noise. Our methodology consists of two steps: an offline stage of learning a joint dictionary from a sequence of LR and HR images of the same region in the chip, followed by a fast-online super-resolution step where the resolution of a new LR image is enhanced. We provide several examples with typical chips used in the microelectronics industry, as well as a statistical study on arbitrary images with characteristic structural features. Conceptually, our method works well when the images have similar characteristics. This work demonstrates that employing sparsity concepts can greatly improve the performance of SEM, thereby considerably increasing the scanning throughput without compromising on analysis quality and resolution.Comment: Final publication available at ACS Nano Letter

An Unsupervised Feature Learning Approach to Improve Automatic Incident Detection

Sophisticated automatic incident detection (AID) technology plays a key role in contemporary transportation systems. Though many papers were devoted to study incident classification algorithms, few study investigated how to enhance feature representation of incidents to improve AID performance. In this paper, we propose to use an unsupervised feature learning algorithm to generate higher level features to represent incidents. We used real incident data in the experiments and found that effective feature mapping function can be learnt from the data crosses the test sites. With the enhanced features, detection rate (DR), false alarm rate (FAR) and mean time to detect (MTTD) are significantly improved in all of the three representative cases. This approach also provides an alternative way to reduce the amount of labeled data, which is expensive to obtain, required in training better incident classifiers since the feature learning is unsupervised.Comment: The 15th IEEE International Conference on Intelligent Transportation Systems (ITSC 2012