Flash‐induced defects in single‐crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy

Jo, Seohyeon; Kindelmann, Moritz; Jennings, Dylan; Balice, Luca; Sohn, Yoo Jung; Scheld, Walter Sebastian; Bram, Martin; Guillon, Olivier; Mayer, Joachim; Raj, Rishi

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oai:juser.fz-juelich.de:1029174

Flash‐induced defects in single‐crystal 8YSZ characterized by TEM, XRD, and Raman spectroscopy

Authors: Seohyeon Jo
Moritz Kindelmann
Dylan Jennings
Luca Balice
Yoo Jung Sohn
Walter Sebastian Scheld
Martin Bram
Olivier Guillon
Joachim Mayer
Rishi Raj
Publication date: 22 May 2026
Publisher: Soc.
Doi

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Last time updated on 02/10/2024

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