Results of research of influence of single mono- and multilayered antireflection coverings on optical characteristics of silicon are discussed. Results received by program system PVlighthouse with the appendix “STGraphs”, developed by authors on a basis “C#9.0”. Spectral curve dependences of an indicator of absorption of light on a thickness of an antireflection covering and base silicon are resulted. Using of multilayered antireflection coverings aren’t sufficient for keeping of absorption level of light at small thickness of silicon. It is expedient to use surfaces texturing wich promote more effective lengthening of a beams way of in a thickness of silicon
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