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oaioai:archive.ugent.be:2085756

Study of electron traps in the thin interfacial oxide layer of Al-, Au- and Sn-n GaAs Schottky barriers by detrapping experiments

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Publication date
1 January 1982
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Doi

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    Ghent University Academic Bibliography

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    Last time updated on 12/11/2016

    This paper was published in Ghent University Academic Bibliography.

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