Dependence of Surface Screening in Semiconductors on the Short-Range Properties of the Bulk Dielectric Function

Cinal M.; Del Sole R.; Krupski J.; Bardyszewski W.; STRINATI CALVANESE, Giancarlo

research article

oai:pubblicazioni.unicam.it:11581/242144

Dependence of Surface Screening in Semiconductors on the Short-Range Properties of the Bulk Dielectric Function

Authors: Cinal M.
Del Sole R.
Krupski J.
Bardyszewski W.
Giancarlo STRINATI CALVANESE
Publication date: 1 January 1987
Publisher
Doi

Abstract

We calculate the induced potential due to a static point charge near a semiconductor surface including ..

info:eu-repo/semantics/article

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Archivio istituzionale della ricerca - Università di Camerino

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Last time updated on 12/11/2016

This paper was published in Archivio istituzionale della ricerca - Università di Camerino.

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