A microprocessor test approach allowing fault localisation

Velazco, Raoul; Ziade, H.; Kolokithas, E.

A microprocessor test approach allowing fault localisation

Authors: Raoul Velazco
H. Ziade
E. Kolokithas
Publication date: 1 January 1985
Publisher: IEEE Comput. Soc. Press, Washington, DC, USA

Abstract

ISBN: 081860641XAn approach allowing functional diagnoses to be stated when testing microprocessors is presented. The approach is implemented on a behavioral test dedicated system: the GAPT system. It is illustrated by results obtained during the test of samples of a second source of the 80C86 microprocessor

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Hal - Université Grenoble Alpes

oai:HAL:hal-00013342v1

Last time updated on 11/11/2016

This paper was published in Hal - Université Grenoble Alpes.

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