A microprocessor test approach allowing fault localisation


ISBN: 081860641XAn approach allowing functional diagnoses to be stated when testing microprocessors is presented. The approach is implemented on a behavioral test dedicated system: the GAPT system. It is illustrated by results obtained during the test of samples of a second source of the 80C86 microprocessor

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Hal - Université Grenoble Alpes

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oaioai:HAL:hal-00013342v1Last time updated on 11/11/2016

This paper was published in Hal - Université Grenoble Alpes.

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