Abstract

In this paper, we have investigated some structural properties, Raman spectra and photoluminescence spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth con-ditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/3523

Similar works

Full text

thumbnail-image

Electronic Sumy State University Institutional Repository

redirect
Last time updated on 01/06/2014

Having an issue?

Is data on this page outdated, violates copyrights or anything else? Report the problem now and we will take corresponding actions after reviewing your request.