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Raman and Photoluminescence Investigation of Films of Solid Solutions Zn1-xMnxTe

By Денис Ігорович Курбатов, Денис Игоревич Курбатов, Denys Ihorovych Kurbatov, Олексій Володимирович Климов, Алексей Владимирович Климов, Oleksii Volodymyrovych Klymov, Анатолій Сергійович Опанасюк, Анатолий Сергеевич Опанасюк, Anatolii Serhiiovych Opanasiuk, Володимир Володимирович Косяк, Владимир Владимирович Косяк, Volodymyr Volodymyrovych Kosiak, D. Nam and H. Cheong

Abstract

In this paper, we have investigated some structural properties, Raman spectra and photoluminescence spectra of Zn1-xMnxTe films deposited by the closed space vacuum sublimation under different growth con-ditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined according to shifting the relative peaks positions. When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/3523

Topics: Diffraction Patterns, Photoluminescence, Raman Spectrometry
Publisher: Sumy State University
Year: 2013
OAI identifier: oai:essuir.sumdu.edu.ua:123456789/35234
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