We extend the orbital-dependent electron tunnelling model implemented within
the three-dimensional (3D) Wentzel-Kramers-Brillouin (WKB) atom-superposition
approach for simulating scanning tunnelling microscopy (STM) by including arbitrary
tip orientations. The orientation of the tip is characterised by a local coordinate
system centered on the tip apex atom obtained by a rotation with respect to the
sample coordinate system. The rotation is described by the Euler angles. Applying
our method, we highlight the role of the real-space shape of the electron orbitals
involved in the tunnelling, and analyse the convergence and the orbital contributions
of the tunnelling current above the W(110) surface depending on the orientation of a
model tungsten tip. We also simulate STM images at constant-current condition, and
find that their quality depends very much on the tip orientation. Some orientations
result in protrusions on the images that do not occur above W atoms. The presence
of such apparent atom positions makes it difficult to identify the exact position of
surface atoms. It is suggested that this tip orientation effect should be considered at
the evaluation of experimental STM images on other surfaces as well. The presented
computationally efficient tunnelling model could prove to be useful for obtaining more
information on the local tip geometry and orientation by comparing STM experiments
to a large number of simulations with systematically varied tip orientations
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