Surface X-ray Diffraction Study of a Bi-Layer Junction Based on Cu and Cd Sulfides for Photovoltaic Applications

Abstract

none9noThis study investigates the crystal structure of thin films of chalcogenides, particularly a junction with a p-type (Cu2S) and an n-type (CdS) layer deposited one on top of the other on a Ag(111) substrate, starting from an aqueous solution and by means of electrochemical atomic layer deposition (E-ALD) (the system is denoted by (Cu2S)60/(CdS)60/Ag(111)).mixedTommaso Baroni; Francesco Di Benedetto; Andrea Giaccherini; Enrico Berretti; Francesca Russo; Annalisa Guerri; Massimo Innocenti; Francesco Carlà; Roberto FeliciBaroni, Tommaso; DI BENEDETTO, Francesco; Giaccherini, Andrea; Berretti, Enrico; Russo, Francesca; Guerri, Annalisa; Innocenti, Massimo; Carlà, Francesco; Felici, Robert