Determination of the Spatial Resolution Function in Energy Filtered TEM and Application to Thin Gate Oxide Measurements at 80 eV Energy Loss

Authors
Publication date
Publisher
'Cambridge University Press (CUP)'
Doi

    Abstract

    Abstract is not available.

      Similar works

      Full text

      thumbnail-image

      Available Versions

      Crossref

      redirect
      Last time updated on 28/11/2020