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Transfer of Si and LiTaO3 thin layers: physics behind a fracture of materials by SmartCutTM technology
Authors
Nikolay Cherkashin
Publication date
19 October 2020
Publisher
HAL CCSD
Abstract
International audienc
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HAL-INSA Toulouse
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oai:HAL:hal-03019217v1
Last time updated on 26/11/2020