research

Measurement of the Inclusive Semi-electronic D0D^0 Branching Fraction

Abstract

Using the angular correlation between the π+\pi^+ emitted in a D+D0π+D^{*+} \rightarrow D^0 \pi^+ decay and the e+e^+ emitted in the subsequent D0Xe+νD^0 \rightarrow Xe^+\nu decay, we have measured the branching fraction for the inclusive semi-electronic decay of the D0D^0 meson to be: {\cal B}(D^0 \rightarrow X e^+ \nu) = [6.64 \pm 0.18 (stat.) \pm 0.29 (syst.)] \%. The result is based on 1.7 fb1^{-1} of e+ee^+e^- collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining the analysis presented in this paper with previous CLEO results we find, \frac{{\cal B} (D^0 \rightarrow X e^+ \nu)} {{\cal B} (D^0 \rightarrow K^- \pi^+)} = 1.684 \pm 0.056 (stat.) \pm 0.093(syst.) and \frac{{\cal B}(D\rightarrow K^-e^+\nu)} {{\cal B}(D\rightarrow Xe^+\nu)} = 0.581 \pm 0.023 (stat.) \pm 0.028(syst.). The difference between the inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and other experiments) is (3.3±7.2)%(3.3 \pm 7.2) \% of the inclusive rate.Comment: Latex file, 33pages, 4 figures Submitted to PR

    Similar works