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In-situ monitoring of the growth of Bi2 Te2 and Sb2 Te3 films and Bi2 Te3-Sb2 Te3 superlattice using spectroscopic ellipsometry
Authors
B. Johs
Brooks O'Quinn
+18Â more
C.M. Herzinger
C.M. Herzinger
C.M. Herzinger
D. Tuomi
D.E. Aspnes
G. Mahan
H. Cui
H. Noro
Hao Cui
Ishwara Bhat
J.B. Theeten
L. Whitlow
R. Droopad
R. Venkatasubramanian
R.M.A. Azzam
Rama Venkatasubramanian
S. Dakshinamurthy
V.D. Das
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Publisher
'Springer Science and Business Media LLC'
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Last time updated on 25/11/2020