VUV-ellipsometry on BexZn1−xSe and BeTe
- Authors
- A. Waag
- A. Waag
- A. Waag
- C. Cobet
- D.E. Aspnes
- F. Fischer
- F.H. Pollak
- G. Landwehr
- H. Lugauer
- J. Barth
- J.L. Freeouf
- J.P. Walter
- J.R. Chelikowsky
- K. Wilmers
- L. Ley
- L. Sham
- L.X. Benedict
- M. Aven
- M. Cardona
- M. Cardona
- M. Cardona
- M. Cardona
- M. Cardona
- M. Cardona
- M. Keim
- N. Esser
- O. Zakharov
- R.G. Dandrea
- R.L. Johnson
- R.M.A. Azzam
- S. Adachi
- S. Albrecht
- S.P. Kowalczyk
- T. Gerhard
- T. Wethkamp
- T. Wethkamp
- Th. Litz
- V. Bousquet
- V. Wagner
- W. Richter
- W.B. Jackson
- Publication date
- Publisher
- 'Springer Science and Business Media LLC'
- Doi
Abstract
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Last time updated on 25/11/2020