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Common Body for Ternary CMOS Logic Gates for Endurance of the Input Pattern Effects on Intermediate State Level
Authors
Esan Jang
Jae Won Jeong
Kyung Rok Kim
Sunhae Shin
Publication date
5 February 2018
Publisher
The Institute Of Electronics And Information Engineers
Abstract
Abstract is not available.
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Last time updated on 23/11/2020