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Label-Free Measurement of Cell–Electrode Cleft Gap Distance with High Spatial Resolution Surface Plasmon Microscopy
Authors
Andreas Offenhäusser
Axelrod D.
+45 more
Barr V. A.
Braun D.
Braun D.
Brittinger M.
Brunsting A.
Brüggemann D.
Chizhik A. I.
Fendyur A.
Giebel K.-F.
Gleixner R.
Hai A.
Halpern A. R.
Hanson L.
Hickel W.
Hickel W.
Hiroshi Kano
Huang B.
Kano H.
Kano H.
Kano H.
Kleinfeld D.
Koji Toma
Limozin L.
Lin Z. C.
Luckham P.
Lynch D. W.
Meyer R. A.
Py C.
Rothenhäusler B.
Santoro F.
Schmitt J. M.
Shinohara H.
Somekh M. G. M.
Sorribas H.
Spira M. E.
Stabler G.
Toma M.
Wang W.
Wang W.
Watanabe K.
Watanabe K.
Wesche M.
Wierzbicki R.
Wrobel G.
Xie C.
Publication date
Publisher
'American Chemical Society (ACS)'
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info:doi/10.1021%2Fnn505521e
Last time updated on 05/11/2020