Shot noise in diffusive mesoscopic conductors, at finite observation
frequencies ω (comparable to the reciprocal Thouless time
τT−1), is analyzed with an account of screening. At low frequencies,
the well-known result SI(ω)=2eI/3 is recovered. This result is valid at
arbitrary ωτT for wide conductors longer than the screening length.
However, at least for two very different systems, namely, wide and short
conductors, and thin conductors over a close ground plane, noise approaches a
different fundamental level, SI(ω)=eI, at ωτT≫1.Comment: 5 pages, 3 figures. Published version. Also available in the
journal's format at
http://hana.physics.sunysb.edu/~yehuda/cv/papers/shotnoise.pd