We have studied the zero magnetic field resistivity of unique high- mobility
two-dimensional electron system in silicon. At very low electron density (but
higher than some sample-dependent critical value, ncr∼1011
cm−2), CONVENTIONAL WEAK LOCALIZATION IS OVERPOWERED BY A SHARP DROP OF
RESISTIVITY BY AN ORDER OF MAGNITUDE with decreasing temperature below 1--2 K.
No further evidence for electron localization is seen down to at least 20 mK.
For ns<Ncr, the sample is insulating. The resistivity is empirically
found to SCALE WITH TEMPERATURE BOTH BELOW AND ABOVE ncr WITH A SINGLE
PARAMETER which approaches zero at ns=ncr suggesting a metal/ insulator
phase transition.Comment: 10 pages; REVTeX v3.0; 3 POSTSCRIPT figures available upon request;
to be published in PRB, Rapid Commu