Noncontact Atomic Force Microscopy and synchrotron x-ray scattering
measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated
Si(100) wafers reveal a narrow temperature range near the bulk C32 melting
point Tb in which a monolayer phase of C32 molecules oriented perpendicular to
surface is stable. This monolayer phase undergoes a delayering transition to a
three-dimensional (3D) fluid phase on heating to just above Tb and to a solid
3D phase on cooling below Tb. An equilibrium phase diagram provides a useful
framework for interpreting the unusual spreading and receding of the monolayer
observed in transitions to and from the respective 3D phases.Comment: 13 pages, 3 figure

Bai, M.

Ehrlich, S. N.

Hansen, F. Y.

Knorr, K.

Mo, H.

Simpson, M. J.

Taub, H.

Trogisch, S.

Volkmann, U. G.

English

arXiv

http://arxiv.org/ftp/cond-mat/papers/0611/0611497.pdfNoncontact Atomic Force Microscopy and synchrotron x-ray scattering measurements on dotriacontane (n-C32H66 or C32) films adsorbed on SiO2-coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point Tb in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above Tb and to a solid 3D phase on cooling below Tb. An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.This work was supported by the U.S. National Science Foundation under Grant No. DMR-0411748, by the Chilean government under FONDECYT Grant Nos. 1010548 and 701058, and by the U.S. Department of Energy under Contract Nos. W-7405-Eng-82 and W-31-109-Eng-38

Nanoscale Observation of Alkane Delayering

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