We present a non-resonant inelastic x-ray scattering study at the carbon
K-edge on aligned poly[9,9-bis(2-ethylhexyl)-fluorene-2,7-diyl] and show that
the x-ray Raman scattering technique can be used as a practical alternative to
x-ray absorption measurements. We demonstrate that this novel method can be
applied to studies on aligned π-conjugated polymers complementing
diffraction and optical studies. Combining the experimental data and a very
recently proposed theoretical scheme we demonstrate a unique property of x-ray
Raman scattering by performing the symmetry decomposition on the density of
unoccupied electronic states into s- and p-type symmetry contributions.Comment: 19 pages, 8 figure
