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Dynamic properties in a family of competitive growing models

Abstract

The properties of a wide variety of growing models, generically called X/RDX/RD, are studied by means of numerical simulations and analytic developments. The study comprises the following XX models: Ballistic Deposition, Random Deposition with Surface Relaxation, Das Sarma-Tamboronea, Kim-Kosterlitz, Lai-Das Sarma, Wolf-Villain, Large Curvature, and three additional models that are variants of the Ballistic Deposition model. It is shown that after a growing regime, the interface width becomes saturated at a crossover time (tx2t_{x2}) that, by fixing the sample size, scales with pp according to tx2(p)py,(p>0)t_{x2}(p)\propto p^{-y}, \qquad (p > 0), where yy is an exponent. Also, the interface width at saturation (WsatW_{sat}) scales as Wsat(p)pδ,(p>0)W_{sat}(p)\propto p^{-\delta}, \qquad (p > 0), where δ\delta is another exponent. It is proved that, in any dimension, the exponents δ\delta and yy obey the following relationship: δ=yβRD\delta = y \beta_{RD}, where βRD=1/2\beta_{RD} = 1/2 is the growing exponent for RDRD. Furthermore, both exponents exhibit universality in the p0p \to 0 limit. By mapping the behaviour of the average height difference of two neighbouring sites in discrete models of type X/RDX/RD and two kinds of random walks, we have determined the exact value of the exponent δ\delta. Finally, by linking four well-established universality classes (namely Edwards-Wilkinson, Kardar-Parisi-Zhang, Linear-MBE and Non-linear-MBE) with the properties of both random walks, eight different stochastic equations for all the competitive models studied are derived.Comment: 23 pages, 6 figures, Submitted to Phys. Rev.

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    Last time updated on 05/06/2019