Low temperature scanning tunneling microscope images and spectroscopic data
have been obtained on subnanometer size Pb clusters fabricated using the
technique of buffer layer assisted growth. Discrete energy levels were resolved
in current-voltage characteristics as current peaks rather than current steps.
Distributions of peak voltage spacings and peak current heights were consistent
with Wigner-Dyson and Porter-Thomas distributions respectively, suggesting the
relevance of random matrix theory to the description of the electronic
eigenstates of the clusters. The observation of peaks rather than steps in the
current-voltage characteristics is attributed to a resonant tunneling process
involving the discrete energy levels of the cluster, the tip, and the states at
the interface between the cluster and the substrate surface.Comment: 4 pages, 4 figure