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A novel approach for fault detection of analog circuit by using improved EEMD
Authors
Alireza Tabrizi Nezhad Kazempour
C Zhang
+19Â more
I Hwang
I Nimmo
M Yektaii
NE Huang
Q Ma
Q Zhang
R Zou
S Krishnan
S Srimani
Seyed Moslem Shokrolahi
V Venkatasubramanian
V Venkatasubramanian
V Venkatsubramanian
WG Fenton
X Li
Y Cui
Y Xiao
Z Liu
Z Wu
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Publisher
'Springer Science and Business Media LLC'
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Last time updated on 23/10/2020