Al abbas, Tarek

Almer, Oscar

Dutton, Neale

Finlayson, Neil

Henderson, Robert

Mattioli Della Rocca, Francescopaolo

A digital silicon photomultiplier in 130-nm CMOS imaging technology implements time-correlated single photon counting at an order of magnitude beyond the conventional pile-up limit. The sensor comprises a 32 × 32 43% fill-factor single photon avalanche diode array with a multi-event folded-flash time-to-digital converter architecture operating at 10 GS/s. 264 bins × 16 bit histograms are generated and read out from the chip at a maximal 188 kHz enabling fast time resolved scanning or ultrafast low-light event capture. Full optical and electrical characterization results are presented

Edinburgh Research Explorer

A CMOS SPAD Sensor with a Multi-Event Folded Flash Time-to-Digital Converter for Ultra-fast Optical Transient Capture

Tarek Al Abbas

Neale A.W. Dutton

Oscar Almer

Neil Finlayson

Francescopaolo Mattioli Della Rocca

Robert Henderson

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IEEE Sensors Journal

A CMOS SPAD Sensor With a Multi-Event Folded Flash Time-to-Digital Converter for Ultra-Fast Optical Transient Capture

https://www.pure.ed.ac.uk/ws/files/53209001/IEEE_Sensors_Paper_METDC_V24.pdf

A CMOS SPAD Sensor with a Multi-Event Folded Flash Time-to-Digital Converter for Ultra-fast Optical Transient Capture

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