MTC Meeting of August 22, 1952

Abstract

Present: R. Best, J. D. Crane, R. R. Everett, W. A. Hosier, R. Hughes, W. Ogden, K. H. Olsen, W. N. Papian, H. J. Platt, R. Sims, H. Smead, N. H. Taylor, R. von Buelow.Decisions and progress relevant to the proposed Memory Test Computer (MTC) are summarized for distribution to those interested, and to trace development of the computer

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