Present: D. R. Brown, J. D. Crane, R. R. Everett, J. W. Forrester, R. G. Farmer, W. A. Hosier, R. Hughes, W. Ogden, K. H. Olsen, W. N. Papian, H. Smead, N. H. Taylor, R. von Buelow.Decisions and progress relevant to the proposed Memory Test Computer (MTC) are summarized for distribution to those interested, and to trace development of the computer