A Novel Broadband Measurement Method for the Magnetoimpedance of Ribbons and Thin Films

Abstract

A novel broad-band measurement method of the MI in thin films and ribbons is presented. It is based on the automated measurement of the reflection coefficient of a cell loaded with the sample. Illustrative results obtained with a permalloy multilayer thin film are presented and discussed.Comment: Paper submitted to International Conference on Magnetism (Rome 2003