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Structural damage studies in conducting indium-tin oxide (ITO) thin films induced by Au<sup>8+</sup> swift heavy ions (SHI) irradiation
Authors
,
DK Avasthi
+7 more
SD Chavhan
NG Deshpande
AA Sagade
R Sharma
F Singh
AK Tripathi
JC Vyas
Publication date
12 September 2007
Publisher
Abstract
Spray pyrolysis deposited indium-tin oxide (ITO) thin films were fabricated and irradiated using Au8+ swift heavy ions (SHI) (100 MeV energy), at different fluency doses ranging between 1×1011 ions/cm2 and 1×1013 ions/cm2. After irradiation, significant changes have been observed in surface morphology and crystallographic structure pertaining to increase in grain size, change in surface roughness, crystallographic disorders of large crystallites, and noticed a net decrease in optical transmittance and electrical resistivity of these films. © 2007 Elsevier Ltd. All rights reserved
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Last time updated on 15/07/2020