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Spectroscopic determination of hole density in the ferromagnetic semiconductor Ga1x_{1-x}Mnx_{x}As

Abstract

The measurement of the hole density in the ferromagnetic semiconductor Ga1x_{1-x}Mnx_{x}As is notoriously difficult using standard transport techniques due to the dominance of the anomalous Hall effect. Here, we report the first spectroscopic measurement of the hole density in four Ga1x_{1-x}Mnx_{x}As samples (x=0,0.038,0.061,0.083x=0, 0.038, 0.061, 0.083) at room temperature using Raman scattering intensity analysis of the coupled plasmon-LO-phonon mode and the unscreened LO phonon. The unscreened LO phonon frequency linearly decreases as the Mn concentration increases up to 8.3%. The hole density determined from the Raman scattering shows a monotonic increase with increasing xx for x0.083x\leq0.083, exhibiting a direct correlation to the observed TcT_c. The optical technique reported here provides an unambiguous means of determining the hole density in this important new class of ``spintronic'' semiconductor materials.Comment: two-column format 5 pages, 4 figures, to appear in Physical Review

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    Last time updated on 03/01/2020