The temperature (T)-shift protcol of aging in the 3 dimensional (3D)
Edwards- Anderson (EA) spin-glass (SG) model is studied through the
out-of-phase component of the ac susceptibility simulated by the Monte Carlo
method. For processes with a small magnitude of the T-shift, ΔT, the
memory imprinted before the T-shift is preserved under the T-change and the
SG short-range order continuously grows after the T-shift, which we call the
cumulative memory scenario. For a negative T-shift process with a large
ΔT the deviation from the cumulative memory scenario has been observed
for the first time in the numerical simulation. We attribute the phenomenon to
the `chaos effect' which, we argue, is qualitatively different from the
so-called rejuvenation effect observed just after the T-shift.Comment: 8 pages, 5 figure