Edge effect removal in Fourier ptychographic microscopy via perfect Fourier transformation (PFT)

Abstract

Edge effect may degrade the imaging precision and is caused by the aperiodic image extension of fast Fourier transform (FFT). In this letter, a perfect Fourier transform algorithm termed PFT was reported to remove the artifacts with comparable efficiency to FFT. Although we demonstrated the performance of PFT in Fourier ptychographic microscopy (FPM) only, it can be expanded in any occasion where the conventional FFT is used.Comment: 4 pages, 6 figure