SUB-MICROMETER RESOLUTION TRANSVERSE ELECTRON BEAM SIZE MEASUREMENT SYSTEM BASED ON OPTICAL TRANSITION RADIATION

Abstract

Optical Transition Radiation (OTR) appears when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by the Point Spread Function (PSF) dimension - The source distribution generated by a single electron and projected by an optical system onto a screen. For small electron beam dimensions, the PSF form significantly depends on various parameters of the optical system like diffraction of the OTR tails, spherical and chromatic aberrations, etc. In our experiment we managed to create a system which can practically measure the PSF distribution and using a new self-calibration method we are able to calculate transverse electron beam size. Here we represent the development, data analysis and novel calibration technique of a sub-micrometer electron beam profile monitor based on the measurements of the PSF shape, which visibility is sensitive to sub-micrometer electron beam dimensions. Copyright © 2011 by IPAC'11/EPS-AG