The effect of defects on the melting profile of short heterogeneous DNA
chains are calculated using the Peyrard-Bishop Hamiltonian. The on-site
potential on a defect site is represented by a potential which has only the
short-range repulsion and the flat part without well of the Morse potential.
The stacking energy between the two neigbouring pairs involving a defect site
is also modified. The results are found to be in good agreement with the
experiments.Comment: 11 pages including 5 postscript figure; To be appear in Phys. Rev.