Thick metallic silver films have been deposited onto Si(111)-(7x7) substrates
at room temperature. Their electronic properties have been studied by using
angle resolved photoelectron spectroscopy (ARPES). In addition to the
electronic band dispersion along the high-symmetry directions, the Fermi
surface topology of the grown films has been investigated. Using ARPES, the
spectral weight distribution at the Fermi level throughout large portions of
the reciprocal space has been determined at particular perpendicular
electron-momentum values. Systematically, the contours of the Fermi surface of
these films reflected a sixfold symmetry instead of the threefold symmetry of
Ag single crystal. This loss of symmetry has been attributed to the fact that
these films appear to be composed by two sets of domains rotated 60o from
each other. Extra, photoemission features at the Fermi level were also
detected, which have been attributed to the presence of surface states and
\textit{sp}-quantum states. The dimensionality of the Fermi surface of these
films has been analyzed studying the dependence of the Fermi surface contours
with the incident photon energy. The behavior of these contours measured at
particular points along the Ag ΓL high-symmetry direction puts forward
the three-dimensional character of the electronic structure of the films
investigated.Comment: 10 pages, 12 figures, submitted to Physical Review