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Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis
Authors
Als-Nielsen
Beckhoff
+55 more
Caby
Caby
Canvel
Chason
Chu
D. Eichert
de Boer
Dirks
E. Nolot
Geissberger
Hong
Honicke
Honicke
Honicke
Hönicke
Ingerle
Ingerle
Ingerle
Jeynes
King
Krämer
Lee
Lin
Lubeck
M. Bernard
M.C. Lépy
Maderitsch
Mantler
Mazel
Mazel
Mrad
Ménesguen
Müller
Nolot
Nolot
P. Hönicke1
Parratt
Pessoa
Pollakowski
Raaijmakers
Rotella
S. Torrengo
Solé
Streeck
Tan
Tempez
Trivedi
Uchibori
Unterumsberger
von Bohlen
Wu
Wu
Y. Mazel
Y. Ménesguen
Zhou
Publication date
Publisher
'Elsevier BV'
Doi
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Abstract
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Last time updated on 05/09/2020