For electron transport in parallel-plane semiconducting structures, a model
is developed that unifies ballistic and diffusive transport and thus
generalizes the Drude model. The unified model is valid for arbitrary magnitude
of the mean free path and arbitrary shape of the conduction band edge profile.
Universal formulas are obtained for the current-voltage characteristic in the
nondegenerate case and for the zero-bias conductance in the degenerate case,
which describe in a transparent manner the interplay of ballistic and diffusive
transport. The semiclassical approach is adopted, but quantum corrections
allowing for tunneling are included. Examples are considered, in particular the
case of chains of grains in polycrystalline or microcrystalline semiconductors
with grain size comparable to, or smaller than, the mean free path. Substantial
deviations of the results of the unified model from those of the ballistic
thermionic-emission model and of the drift-diffusion model are found. The
formulation of the model is one-dimensional, but it is argued that its results
should not differ substantially from those of a fully three-dimensional
treatment.Comment: 14 pages, 5 figures, REVTEX file, to appear in J. Phys.: Condens.
Matte