Spectral density of current fluctuations at zero frequency is calculated for
a long diffusive SNS junction with low-resistive interfaces. At low
temperature, T << Delta, the subgap shot noise approaches linear voltage
dependence, S=(2/ 3R)(eV + 2Delta), which is the sum of the shot noise of the
normal conductor and voltage independent excess noise. This result can also be
interpreted as the 1/3-suppressed Poisson noise for the effective charge q =
e(1+2Delta/eV) transferred by incoherent multiple Andreev reflections (MAR). At
higher temperatures, anomalies of the current noise develop at the gap
subharmonics, eV = 2Delta/n. The crossover to the hot electron regime from the
MAR regime is analyzed in the limit of small applied voltages.Comment: improved version, to be published in Phys. Rev.