We study by numerical simulations the scattering of s-polarized light from
a rough dielectric film deposited on the planar surface of a semi-infinite
perfect conductor. The dielectric film is allowed to be either active or
passive, situations that we model by assigning negative and positive values,
respectively, to the imaginary part ϵ2​ of the dielectric constant of
the film. We study the reflectance R and the total scattered energy
U for the system as functions of both ϵ2​ and the angle of
incidence of the light. Furthermore, the positions and widths of the enhanced
backscattering and satellite peaks are discussed. It is found that these peaks
become narrower and higher when the amplification of the system is increased,
and that their widths scale linearly with ϵ2​. The positions of the
backscattering peaks are found to be independent of ϵ2​, while we find
a weak dependence on this quantity in the positions of the satellite peaks.Comment: Revtex, 9 pages, 9 figure