Scaling properties of an interface representation of the critical contact
process are studied in dimensions 1 - 3. Simulations confirm the scaling
relation beta_W = 1 - theta between the interface-width growth exponent beta_W
and the exponent theta governing the decay of the order parameter. A scaling
property of the height distribution, which serves as the basis for this
relation, is also verified. The height-height correlation function shows clear
signs of anomalous scaling, in accord with Lopez' analysis [Phys. Rev. Lett.
83, 4594 (1999)], but no evidence of multiscaling.Comment: 10 pages, 9 figure