The CdTe thin and thick films were obtained by the close
spaced vacuum sublimation technique on a glass substrate
under the following growth conditions: the evaporator
temperature was 620 °C; and the substrate temperature
was varied in the range from 250 °C to 550 °C. High
purity CdTe powder was used as a charge for evaporation.
The Raman spectra were measured using TRIAX 320
and TRIAX 550 spectrometers at room temperature. The
488-nm line and 514.5-nm line of an Ar+ laser and a
785-nm diode laser were used as excitation sources. The
signal was collected by the liquid nitrogen cooled chargecoupled-device (CCD) detector. A number of intense
Raman peaks at 140, 167, 190, 271, 332 and 493 cm-1
were observed and were interpreted as TO (140 cm-1),
1LO (167 cm-1), 2LO (332 cm-1), 3LO (493 cm-1) phonon
modes and plasmon-phonon mode (190 cm-1). The presence
of several phonon replicas in the Raman spectra
confirms high crystal quality of the samples.
When you are citing the document, use the following link http://essuir.sumdu.edu.ua/handle/123456789/37061This work is supported by the Ukraine State Agency for the Science, Innovation, and Informatization and by the NRF grant funded by the MEST of Korea (2011-0019204) and by the Ministry of Education and Science of Ukraine
