Polycrystalline Cd1 xZnxTe thick films with thicknesses of about 30 μm have been deposited on a Mo coated glass substrate by means of close-spaced vacuum sublimation technique. X-ray diffraction measurements have shown that the films obtained have only cubic zinc blende phase. The influence of Zn concentration on the photoluminescence (PL) spectra of Cd1 xZnxTe films was investigated. This let us determine the nature and energy structure of the intrinsic defects and residual impurities in the films.This work was supported by Grant State Fund for Fundamental Research (project NGP/F61/087) and by the Ministry of Education and Science of Ukraine (Grant no. 0110U001151) by the National Academy of Sciences of Ukraine (Grants nos. BС-157-15 and B-146-15)
