This thesis presents a novel hierarchical fault-tolerance methodology for fault recovery in reconfigurable devices.
As the semiconductor industry moves to producing ever smaller transistors, the number of faults occurring increases. At current technology nodes, unavoidable variations in production cause transistor devices to perform outside of ideal ranges. This variability manifests as faults at higher levels and has a knock-on effect for yields. In some ways, fault tolerance has never been more important.
To better explore the area of variability, a novel reconfigurable architecture was designed: Programmable Analogue and Digital Array (PAnDA). By allowing reconfiguration from the transistor level to the logic block level, PAnDA allows for design space exploration, previously only available through simulation, in hardware. The main advantage of this is that design modifications can be tested almost instantaneously, as opposed to running time consuming transistor-level simulations.
As a result of this design, each level of PAnDA’s configuration contains structural homogeneity, allowing multiple implementations of the same circuit on the same hardware. This potentially creates opportunities for fault tolerance through reconfiguration, and so experimental work is performed to discover how best to utilise these properties of PAnDA.
The findings show that it is possible to optimise the reconfiguration in the event of a fault, even if the nature and location of the fault are unknown
