Combined improved EEMD with SVM in ultra-low-dimensional ultra-small-sample application of multi-classification intelligent fault diagnosis

Abstract

In actual intelligent fault diagnosis of mechanical equipment, the sample data that can be measured is very limited. How to identify the type of fault relies on as little as possible of the sample and as low as possible of the low-dimensional feature vector uniquely require research in actual mechanical machinery and equipment intelligent fault diagnosis. By using the threshold noise reduction, improving the cubic spine interpolation, signal SVM extending and so on to improve EEMD method; researched the cross-validation model grid optimization SVM parameters, obtained the optimal parameters of SVM by using Sigmoid kernel function; applied optimal excellent SVM parameters, SVM by using Sigmoid kernel function in the ultra-low-dimensional ultra-small-sample four categories intelligent fault diagnosis classification accuracy rate reached 100 %, SVM parameter optimization can enhance the method combined the improved EEMD with SVM in ultra-low-dimensional ultra-small-sample four categories fault diagnosis accuracy

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