Mechanisms for conduction via low-frequency noise measurements of High-Tc Thin-film microbridges

Abstract

We have investigated possible mechanisms for conduction in high-T/sub c/ thin-film microbridges biased into the voltage state via the low-frequency noise properties. Measurements on thinned YBCO microbridges indicate that the voltage noise power spectral density S/sub V/(f) is proportional to the DC voltage.Peer Reviewe