Far field prediction of radiated emission from pcb using near-field measurement

Abstract

This report presents a new near field to far field transformation by using a statistical model approach that has yet to be introduced in the EMC community. The report begins with the introduction of near field to far field transformation which includes the background, motivation, objectives and scope of the project. Next, it will provide theoretical background on the EMC topics and the relationship between near field and far field. The advantages of near field to far field transformation approach are numerous and the transformation has received considerable attention and vast interest from the EMC community over the last few years. A few different approaches will thus be presented in the literature review in chapter two. The main body of the report discusses in detail the methodology of computing far field prediction using two different types of averaging methods. The mathematical principles and reasons behind each averaging method were explained in chapter three and the transformation results will be presented in chapter four, where predicted and actual measure far fields were compared and analyzed in depth. Lastly, the report will end with a conclusion to explain each averaging method and decide on the final approach used and recommendation for future work.Bachelor of Engineerin

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