Allen

Guérin

Ishino

Jonathan Andrew Hinks

Thackery

English

Hinks, J. A.

University of Huddersfield Repository

A combined heavy ion accelerator-electron microscope for the direct observation of radiation effects,”

A combined heavy ion accelerator-electron microscope for the direct observation of radiation effects,” Harwell,

A heavy-ion acceleratorelectron microscope link for the direct observation of ion irradiation effects,”

A review of in situ observation of defect production with energetic heavy ions,”

A review of transmission electron microscopes with in situ ion irradiation,” Nucl. Instruments Methods Phys.

Adaptation of an ion accelerator to a high voltage electron microscope,”

Adaptation of an ion implanter on a 100 kV electron microscope for in situ irradiation experiments,”

Concurrent in situ ion irradiation transmission electron microscope,”

Correlative Microscopy Using

Dimensional changes and radiation creep of graphite at very high neutron doses,”

Direct observation of radiation damage produced in copper, gold and aluminum during ion bombardments at low temperatures in the electron microscope,”

Dynamic microstructural evolution of graphite under displacing irradiation,”

Establishment of in situ TEM–implanter/accelerator interface facility at

Facilities for in situ ion beam studies in transmission electron microscopes,”

Focused Ion Beam Interfaced with a 200 keV Transmission Electron Microscope for In

Fundamentals of Radiation Materials Science: Metals and Alloys,

High Resolution Transmission Electron Microscopy of Defect Clusters

Improved TEM samples of semiconductors prepared by a small-angle cleavage technique.,”

In situ EELS and TEM observation of silicon carbide irradiated with helium ions at low temperature and successively annealed,”

In situ implantation system in argonne national laboratory hvem-tandem facility,”

In situ ion- and electron-irradiation effects studies in transmission electron microscopes,”

In situ study of microstructural evolution in molybdenum during irradiation with low energy hydrogen ions,”

In situ transmission electron microscopy employed for studies of effects of ion and electron irradiation on materials.,”

In-Situ Analysis of Ion Irradiation and Implantation Effects,”

In-situ observation of radiation damage by 400 keV heavy ions,”

In-situ observation of the microstructural evolution in germanium under the low-energy helium ion irradiation,”

Ion damage to metal films inside an electron microscope,”

JANNUS: experimental validation at the scale of atomic modelling,”

Lattice parameter and dimensional changes in graphite irradiated between 300 and 1350°C,”

Materials challenges for advanced nuclear energy systems,”

Measurement of the ion flux emanating from oxide coated emission filaments in a Siemens electron microscope,”

MIAMI: Microscope and ion accelerator for materials investigations,”

Multiple ion beam irradiation and implantation:

New Instrumentation in Argonne’s Hvem-Tandem Facility: Expanded Capability for in

Small-angle cleavage of semiconductors for transmission electron microscopy,”

SRIM – The stopping and range of ions in matter

Time and temperature dependence of cascade induced defect production in in situ experiments and computer simulation,”

Transmission electron microscope interfaced with ion accelerators and its application to materials science,”

Transmission electron microscopy with in situ ion irradiation

Crossref

Journal of Materials Research

The macroscopic properties of materials exposed to irradiation are determined by radiation damage effects which occur on the nanoscale. These phenomena are complex dynamic processes in which many competing mechanisms contribute to the evolution of the microstructure and thus to its end-state. To explore and understand the behavior of existing materials and to develop new technologies, it is highly advantageous to be able to observe the microstructural effects of irradiation as they occur. Transmission electron microscopy with in situ ion irradiation is ideally suited to this kind of study. This review focuses on some of the important factors in designing this type of experiment including sample preparation and ion beam selection. Also presented are a brief history of the development of this technique and an overview of the instruments in operation today including the latest additions.</p

Hinks, Jonathan Andrew

Huddersfield Research Portal

Transmission electron microscopy with in situ ion irradiation

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Huddersfield Research Portal