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SYSTEM FOR AND METHOD OF INVESTIGATING THE EXACT SAME POINT ON A SAMPLE SUBSTRATE WITH MULTIPLE WAVELENGTHS
Authors
Christopher A. Goeden
Ping He
+6Â more
Craig M. Herzinger
Blaine D. Johs
Martin M. Liphardt
Galen L. Pfeiffer
James D. Welch
John A. Woollam
Publication date
3 May 2007
Publisher
DigitalCommons@University of Nebraska - Lincoln
Abstract
Disclosed are system for and method of analyzing a sample at substantially the exact same small spot point on a sample with a plurality of wavelengths
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Last time updated on 13/04/2020