X-ray nanodiffraction with in situ load and pressure

Abstract

Scanning X-ray nanodiffraction (SXND) is an excellent tool for materials science. It readily serves structural information with sub-µm spatial resolution from crystalline and semi-crystalline materials (metals, biomaterials, synthetic compounds). That way grain orientation, residual stress profiles, crystal structure or texture can be obtained in a non-destructive analysis. Provided a sufficiently high energy and long focal distance of the SXND experiments can be performed on strongly absorbing metallic samples and in extended sample environments, making SXND of course a highly desirable method for materials science.SXND experiments were performed with a beam size of down to 350 x 250 nm² with in situ high pressure application and with in situ nanoindentation, using homebuilt sample environments and the conditions at the Nanofocus Endstation of beamline P03 (PETRA III, Hamburg). A hydrostatic pressure cell was used in combination with a 19 keV nanobeam for the first time in order to record spatially resolved data from fractured non-microscopic metallic samples at (truly isotropic) hydrostatic conditions below 1 GPa. The nanoindentation setup on the other hand was used to apply directed strains of similar magnitude onto metallic samples at 15 keV in order to observe processes inducing fracture.This contribution outlines the technical realization of these experiments and presents data that demonstrates how high resolution X-ray diffraction techniques are not restricted to static and compact sample systems. As data were also recorded from high Z samples (Ag, W) it shows how SXND bears a huge potential specifically for materials science related research

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